Imaging spectrometer wide field catadioptric design

ABSTRACT

A wide field catadioptric imaging spectrometer with an immersive diffraction grating that compensates optical distortions. The catadioptric design has zero Petzval field curvature. The imaging spectrometer comprises an entrance slit for transmitting light, a system with a catadioptric lens and a dioptric lens for receiving the light and directing the light, an immersion grating, and a detector array. The entrance slit, the system for receiving the light, the immersion grating, and the detector array are positioned wherein the entrance slit transmits light to the system for receiving the light and the system for receiving the light directs the light to the immersion grating and the immersion grating receives the light and directs the light through the system for receiving the light to the detector array.

The United States Government has rights in this invention pursuant toContract No. W-7405-ENG-48 between the United States Department ofEnergy and the University of California for the operation of LawrenceLivermore National Laboratory.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application has new improved designs, smaller sizes with widerfields of view compared with those previously given in PatentApplication Publication US 2005/0073680 A1, “Imaging SpectrometerUtilizing Immersed Gratings with Accessible Entrance Slit,” Chrisp et alpublication date Apr. 7, 2005.

BACKGROUND

1. Field of Endeavor

The present invention relates to a spectrometer and more particularly toa compact catadioptric imaging spectrometer designed for a wide field ofview with larger format detectors.

2. State of Technology

U.S. Pat. No. 5,717,487 provides the following state of technologyinformation: “A spectrometer is a known instrument for examining thespectral characteristics of light. Light emitted from or reflected by anobject is received within the spectrometer and separated into itsspectral components, such as the red, green and blue colored spectra asoccurs in equal intensity when standard white light is so analyzed. Theintensity of each such spectral component of that received light may bereadily observed and measured. Each element of nature, molecularcomponents, organic and inorganic compounds, living plants, man, animaland other substances is known to emit a unique spectrum that may be usedas an indicium to identify the emitter.”

United States Patent Application Serial No. 2002/0135770 published Sep.26, 2003 provides the following state of technology information:“Imaging spectrometers have been applied to a variety of disciplines,such as the detection of defects in industrial processes, satelliteimaging, and laboratory research. These instruments detect radiationfrom a sample and process the resulting signal to obtain and present animage of the sample that includes spectral and chemical informationabout the sample.”

U.S. Pat. No. 6,078,048 provides the following state of technologyinformation: “In recent years substantial effort has been directed tothe problem of detection of airborne chemicals. The remote detection ofairborne chemicals issuing from exhaust stacks, vehicle exhaust, andvarious exhaust flumes or plumes, offers a non-intrusive means fordetecting, monitoring, and attributing pollution source terms. Todetect, identify, and quantify a chemical effluent, it is highlydesirable to operate at the limiting spectral resolution set byatmospheric pressure broadening at approximately 0.1 cm⁻¹ This providesfor maximum sensitivity to simple molecules with the narrowest spectralfeatures, allows for corrections for the presence of atmosphericconstituents, maximizing species selectivity, and provides greateropportunity to detect unanticipated species.”

U.S. Pat. No. 5,880,834 provides the following state of technologyinformation: “There are three problems in designing an imagingspectrometer where light in a slice of an image field passing through anentrance slit is to be diffracted by a grating parallel to the slit andimaged onto a focal plane for display or recording with good spatialresolution parallel to the slit and good spectral resolutionperpendicular to the slit: 1. Eliminating astigmatism over the spectrumon the image plane. 2. Removing field curvature from the spectrumfocused onto the image plane. 3. Obtaining good spatial resolution ofthe entrance slit which involves eliminating astigmatism at differentfield angles from points on the entrance slit.”

SUMMARY

Features and advantages of the present invention will become apparentfrom the following description. Applicants are providing thisdescription, which includes drawings and examples of specificembodiments, to give a broad representation of the invention. Variouschanges and modifications within the spirit and scope of the inventionwill become apparent to those skilled in the art from this descriptionand by practice of the invention. The scope of the invention is notintended to be limited to the particular forms disclosed and theinvention covers all modifications, equivalents, and alternativesfalling within the spirit and scope of the invention as defined by theclaims.

The present invention provides a compact imaging spectrometer with animmersive or reflective diffraction grating that compensates opticaldistortions. The imaging spectrometer comprises an entrance slit fortransmitting light, a system with a catadioptric lens and a dioptriclens for receiving the light and directing the light, an immersiongrating, and a detector array. The entrance slit, the system forreceiving the light, the immersion grating, and the detector array arepositioned wherein the entrance slit transmits light to the system forreceiving the light and the system for receiving the light directs thelight to the immersion grating and the immersion grating receives thelight and directs the light through the system for receiving the lightto the detector array.

The compact imaging spectrometer uses smaller cryogenic coolersfacilitating its using in portable (man carried) gas detection systemsand in small unmanned aerial vehicles for remote gas detection. Theseinstruments have application for Homeland Defense to check for thepresence of biological or chemical weapons without entering thecontaminated areas. These instruments can be used for pollutiondetection, and remote sensing of agricultural crops, and geologicalidentification. They can also be used for the remote monitoring ofindustrial processes. The wider field of view of this design enableslarger swath widths for the remote sensing of larger areas with singlepass overflights and is extensible to take advantage of larger format ormosaiced infrared detector arrays.

The invention is susceptible to modifications and alternative forms.Specific embodiments are shown by way of example. It is to be understoodthat the invention is not limited to the particular forms disclosed. Theinvention covers all modifications, equivalents, and alternativesfalling within the spirit and scope of the invention as defined by theclaims. This invention can be adapted to different spectral regions bysuitable choice of refractive and reflective materials, and withdifferent detector arrays.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings, which are incorporated into and constitute apart of the specification, illustrate specific embodiments of theinvention and, together with the general description of the inventiongiven above, and the detailed description of the specific embodiments,serve to explain the principles of the invention.

FIG. 1 illustrates an embodiment of a wide field imaging spectrometerconstructed in accordance with the present invention using acatadioptric lens and dioptric lens to provide the correction over adetector array with a format of 512 spatial pixels by 256 spectralpixels.

FIG. 2 is an isometric view of an embodiment of a wide field imagingspectrometer constructed in accordance with the present invention usinga catadioptric lens and dioptric lens to provide the correction over adetector array with a format of 512 spatial pixels by 256 spectralpixels.

FIG. 3 illustrates an embodiment of a very wide field imagingspectrometer constructed in accordance with the present invention usinga catadioptric lens and a dioptric lens to provide the correction over adetector array with a format of 1024 spatial pixels by 256 spectralpixels.

FIG. 4 is a plan view of an embodiment of a very wide field imagingspectrometer constructed in accordance with the present invention usinga catadioptric lens and dioptric lens to provide the correction over adetector array with a format of 1024 spatial pixels by 256 spectralpixels.

FIG. 5 illustrates an embodiment of an imaging spectrometer constructedin accordance with the present invention using a catadioptric lens and adioptric lens to provide the correction over a detector array with aformat of 256 spatial pixels by 256 spectral pixels.

FIG. 6 is an isometric view of an embodiment of an imaging spectrometerconstructed in accordance with the present invention using acatadioptric lens and dioptric lens to provide the correction over adetector array with a format of 256 spatial pixels by 256 spectralpixels.

FIG. 7 illustrates an embodiment of a wide field imaging spectrometerconstructed in accordance with the present invention using acatadioptric lens and a dioptric lens to provide the correction over adetector array with a format of 1024 spatial pixels by 256 spectralpixels. In this case the optical design has been reversed to reflectfrom the catadioptric lens immediately before the detector.

FIG. 8 is a plan view of an embodiment of a wide field imagingspectrometer constructed in accordance with the present invention usinga catadioptric lens and a dioptric lens to provide the correction over adetector array with a format of 1024 spatial pixels by 256 spectralpixels. In this case the optical design has been reversed to reflect offthe catadioptric lens immediately before the detector.

DETAILED DESCRIPTION OF THE INVENTION

Referring now to the drawings, to the following detailed description,and to incorporated materials, detailed information about the inventionis provided including the description of specific embodiments. Thedetailed description serves to explain the principles of the invention.The invention is susceptible to modifications and alternative forms. Theinvention is not limited to the particular forms disclosed. Theinvention covers all modifications, equivalents, and alternativesfalling within the spirit and scope of the invention as defined by theclaims.

Referring now to FIG. 1 of the drawings, an embodiment of a wide fieldimaging spectrometer constructed in accordance with the presentinvention is illustrated. This embodiment of the present invention isdesignated generally by the reference numeral 100. FIG. 1 is a raytraceof the imaging spectrometer 100. The structural elements of the compactimaging spectrometer 100 include an entrance slit 101, a catadioptriclens 105-106, an immersive grating 103-104, a dioptric lens 107-108, anda detector 109.

The light passes from the entrance slit 101 to the catadioptric lens105-106 refracting through the first surface 105 and reflecting off theback 106 of the lens, which has a continuous convex surface but has areflective coating on the upper half. The light refracts through thefront of the lens 105 and proceeds to the immersive grating 103-104. Thelight refracts through the front of grating 103 and is then dispersed bythe reflective grating on the back surface 104 and refracts out throughthe front 103 of the grating to catadioptric lens 105-106. This time thelight travels through 105-106, and then is focused through lens 107-108on to the detector array 109. For detector array 109 the spatialdimension is in the X dimension and the spectral dispersion is in the Ydimension. The aperture cold stop is close to surface 103 with the beamfrom the entrance slit and the exit beam to the detector approximatelytelecentric. This provides good distortion control for focusing thedetector.

The grating can be generated by a ruling engine, replication,holographically, or by e-beam lithography. Grating 103-104 is tilted andwedged such that the ghost reflections from the front 103 of the gratingdo not fall on the detector 109. The stray light is also controlled byadjusting the curvature of surface 105 so that the ghost reflection ofthe light from the entrance slit off surface 105 misses the grating103-104. The ghost reflection may also be utilized by an additionaldetector. FIG. 2 is an isometric view of the spectrometer shown in FIG.1.

The imaging spectrometer 100 has been designed to the requirements inTable 1 and is diffraction limited over the wavelength range withexcellent spatial and spectral resolutions. TABLE 1 Spectral Range7.5-13.5 microns F-number (round or square) 3.5 Detector array 512spatial × 256 spectral Pixel Size 40 microns Entrance Slit Length 20.48mm Spatial Distortion: (change in <0.1 pixel (<±2 microns) SpatialMapping with Wavelength) Spectral Distortion: Spectral Smile <0.1 pixel(<±2 microns) Optical Performance Diffraction Limited Ghosting <0.1% ofthe primary image

The spectral slit curvature has been corrected to less than one tenth ofa pixel over the detector array. This is the curvature of slit image onthe detector 109 at a single wavelength, which is a common problem withimaging spectrometer designs. The spatial mapping distortion has alsobeen corrected to less than one tenth of a pixel over the fullwavelength range, so the spectrum from a single point in the entranceslit will not wander from the center of a row of pixels by less than ±2microns. Correcting the spectral slit curvature and the spatial mappingdistortion with wavelength to less than one tenth of a pixel ensuresthat the images do not have to be resampled to correct for theseeffects. The nominal design has much better distortion correction thanthe requirements in the Table 1.

One important feature of this design, enabling it to be used over a widefield of view than previous designs (Patent Application Publication US2005/0073680 A1, “Imaging Spectrometer Utilizing Immersed Gratings withAccessible Entrance Slit,” Chrisp et al publication date Apr. 7, 2005),is that it has zero Petzval field curvature. The field curvature fromthe positive mirror section is of opposite sign and cancels with thefield curvature sum from the rest of the positive refractive surfaces.

The optical prescription for the imaging spectrometer in FIG. 1 is givenTABLE 2 Optical Prescription X angle reference Surface notes Y (mm) Z(mm) (degrees) Radius (mm) 101 slit 16.67 −32.71 105 1st lens frontsurface 0 0 0 1409.222 cc 106 1st lens mirror/back surface 0 4.5 0226.702 cx 107 2nd lens front surface 0 4.6 0 293.872 cx 108 2nd lensback surface 0 10.6 0 301.896 cx 103 grating front surface −0.13 −28.370.072 aspheric 104 grating ruled surface −0.14 −30.77 −0.616 flat 109detector surface −2.14 41.35 −0.429 flat(global surface coordinates with respect to first lens 105)in TABLE 2, where cc stands for a concave surface and cx is a convexsurface. The origin of the global coordinate system is at the center ofthe lens front face 105, and positive X rotation angles areanti-clockwise about the X axis. The lenses 105-106 and 107-108, andgrating 103-104 are made from germanium; the grating period is 0.0194mm. The sagittal equation of the fourth order rotationally symmetricasphere on grating surface 103 is given by:z=0.126E−5 (x ² +y ²)²This is an example of a typical design prescription, and the dimensionsare given at an operational temperature of approximately 50K.

Small size for an infrared imaging spectrometer is extremely importantbecause it determines the requirements for the cryogenic cooling. Forexample, if the spectrometer is small it can fly in a small UAV. Also,if the spectrometer is small it is person portable. The imagingspectrometer 100 has a size envelope that is smaller than spectrometerscurrently in use for its wide field. The entrance slit 101, catadioptriclens 105-106, dioptric lens 107-108, immersion grating 103-104, anddetector 109 fit within the envelope. The Y axis and the Z axis areshown in the plane of the paper in FIG. 1. The X axis extendsperpendicular to both the Y axis and the Z axis. The envelope is acylinder 6 cm diameter by 7.5 cm long. As shown in FIG. 1, the X axis is6 cm, the Y axis is 6 cm, and the Z axis is 7.5 cm. The entrance slit101 is located at or near the front and detector 109 is located at ornear the back.

Referring now to FIG. 3 of the drawings, an embodiment of a very widefield imaging spectrometer constructed in accordance with the presentinvention is illustrated. This embodiment of the present invention isdesignated generally by the reference numeral 300. FIG. 3 is a raytraceof the imaging spectrometer 300. The structural elements of the compactimaging spectrometer 300 include an entrance slit 301, a catadioptriclens 305-306, an immersive grating 303-304, a dioptric lens 307-308, anda detector 309. FIG. 4 is a plan view of the spectrometer shown in FIG.3 as a cross-sectional view.

The light passes from the entrance slit 301 to the catadioptric lens305-306 refracting through the first surface 305 and reflecting off theback 306 of the lens, which has a continuous convex surface but has areflective coating on the upper half. The light refracts through thefront of the lens 305 and proceeds to the immersive grating 303-304. Thelight refracts through the front of grating 303 and is then dispersed bythe reflective grating on the back surface 304 and refracts out throughthe front of the grating 303 to catadioptric lens 305-306. This time thelight travels through 305-306, and then is focused through lens 307-308and on to the detector array 309. For detector array 309 the spatialdimension is in the X dimension and the spectral dispersion is in the Ydimension. The aperture cold stop is close to surface 303 with the beamfrom the entrance slit and the exit beam to the detector approximatelytelecentric. The grating can be generated by a ruling engine,replication, holographically, or by e-beam lithography. Grating 303-304is tilted and wedged such that the ghost reflections from the front 303of the grating do not fall on the detector 309.

The imaging spectrometer 300 has been designed to the requirements inTable 3 and is diffraction limited over the wavelength range withexcellent spatial and spectral resolutions. TABLE 3 Spectral Range7.5-13.5 microns F-number (square or round) 3.5 Detector array 1024spatial × 256 spectral Pixel Size 40 microns Entrance Slit Length 40.96mm Spatial Distortion: (change in <0.1 pixel (<±2 microns) SpatialMapping with Wavelength) Spectral Distortion: Spectral Smile <0.1 pixel(<±2 microns) Optical Performance Diffraction Limited Ghosting <0.1% ofthe primary image

The spectral slit curvature has been corrected to less than one tenth ofa pixel over the detector arrays. This is the curvature of slit image onthe detector 309 at a single wavelength, which is a common problem withimaging spectrometer designs. The spatial mapping distortion has alsobeen corrected to less than one tenth of a pixel over the fullwavelength range. This means that the spectrum from a single point inthe entrance slit will not wander from the center of a row of pixels byless than ±2 microns. Correcting the spectral slit curvature and thespatial mapping distortion with wavelength to less than one tenth of apixel ensures that the images do not have to be resampled to correct forthese effects. The nominal design has much less distortion than thenumbers in Table 3.

One important feature of this design enabling it to be used over a widefield of view than previous designs (Patent Application Publication US2005/0073680 A1, “Imaging Spectrometer Utilizing Immersed Gratings withAccessible Entrance Slit,” Chrisp et al publication date Apr. 7, 2005),is that it has zero Petzval field curvature. The field curvature fromthe positive mirror section is of opposite sign and cancels with thefield curvature sum from the rest of the positive refractive surfaces.

Small size for an infrared imaging spectrometer is extremely importantbecause it determines the requirements for the cryogenic cooling. Forexample, if the spectrometer is small it can fly in a small UAV. Theimaging spectrometer 300 has a size envelope that is extremely efficientgiven the 1024 spatial pixel width. The entrance slit 301, catadioptriclens 305-306, dioptric lens 307-308, immersion grating 303-304, anddetector 309 fit within the envelope. The Y axis and the Z axis areshown in the plane of the paper in FIG. 3. The X axis extendsperpendicular to both the Y axis and the Z axis. As shown in FIG. 3, theX axis is 9 cm, the Y axis is 6 cm, and the Z axis is 10 cm. Theentrance slit 301 is located at or near the front and the detector 309is located at or near the back.

Referring now to FIG. 5 of the drawings, an embodiment of a very compactimaging spectrometer constructed in accordance with the presentinvention is illustrated. This embodiment of the present invention isdesignated generally by the reference numeral 500. FIG. 5 is a raytraceof the imaging spectrometer 500. The structural elements of the compactimaging spectrometer 500 include an entrance slit 501, a catadioptriclens 505-506, a dioptric lens 507-508, an immersive grating 503-504, anda detector 509. FIG. 6. is an isometric view of the spectrometer shownin FIG. 5 as a cross-sectional view.

The light passes from the entrance slit 501 to the catadioptric lens505-506 refracting through the first surface 505 and reflecting off theback 506 of the lens, which has a continuous convex surface but has areflective coating on the upper half. The light refracts through thefront of the lens 505 and proceeds to the immersive grating 503-504. Thelight refracts through the front of grating 503 and is then dispersed bythe reflective grating on the back surface 504 and refracts out throughthe front of the grating 503 to catadioptric lens 505-506. This time thelight travels through 505-506, and then is focused through lens 507-508and on to the detector array 509. For detector array 509 the spatialdimension is in the X dimension and the spectral dispersion is in the Ydimension. The aperture cold stop is close to surface 503 with the beamfrom the entrance slit and the exit beam to the detector approximatelytelecentric.

The grating can be generated by a ruling engine, replication,holographically, or by e-beam lithography. Grating 503-504 is tilted andwedged such that the ghost reflections from the front 503 of the gratingdo not fall on the detector 509. The imaging spectrometer 500 has beendesigned to the requirements in Table 4 and is diffraction limited overthe wavelength range with excellent spatial and spectral resolutions.TABLE 4 Spectral Range 7.5-13.5 microns F-number (square or round) 3.5Detector array 256 spatial × 256 spectral Pixel Size 40 microns EntranceSlit Length 10.24 mm Spatial Distortion: (change in <0.1 pixel (<±2microns) Spatial Mapping with Wavelength) Spectral Distortion: SpectralSmile <0.1 pixel (<±2 microns) Optical Performance Diffraction LimitedGhosting <0.1% of the primary image

The spectral slit curvature has been corrected to less than one tenth ofa pixel over the detector arrays. This is the curvature of slit image onthe detector 509 at a single wavelength, which is a common problem withimaging spectrometer designs. The spatial mapping distortion has alsobeen corrected to less than one tenth of a pixel over the fullwavelength range. This means that the spectrum from a single point inthe entrance slit will not wander from the center of a row of pixels byless than ±2 microns. Correcting the spectral slit curvature and thespatial mapping distortion with wavelength to less than one tenth of apixel ensures that the images do not have to be resampled to correct forthese effects.

One important feature of this design compared with previous designs(Patent Application Publication US 2005/0073680, “Imaging SpectrometerUtilizing Immersed Gratings with Accessible Entrance Slit,” Chrisp et alpublication date Apr. 7, 2005), is that it has zero Petzval fieldcurvature. The field curvature from the positive mirror section is ofopposite sign and cancels with the field curvature sum from the rest ofthe positive refractive surfaces.

Small size for an infrared imaging spectrometer is extremely importantbecause it determines the requirements for the cryogenic cooling. Forexample, if the spectrometer is small it can fly in a small UAV. Theimaging spectrometer 500 has a size envelope that is extremely efficientgiven the 256 spatial pixel width. The entrance slit 501, catadioptriclens 505-506, dioptric lens 507-508, immersion grating 503-504, anddetector 509 fit within the envelope. The Y axis and the Z axis areshown in the plane of the paper in FIG. 5. The X axis extendsperpendicular to both the Y axis and the Z axis. As shown in FIG. 5, theX axis is 3.4 cm, the Y axis is 3.4 cm, and the Z axis is 4 cm. Theentrance slit 501 is located at or near the front and the detector 509is located at or near the back.

Referring now to FIG. 7 of the drawings, an embodiment of a wide fieldimaging spectrometer constructed in accordance with the presentinvention is illustrated. In this case the optical design has a reverseform compared with the previous cases. This embodiment of the presentinvention is designated generally by the reference numeral 700. FIG. 7is a raytrace of the imaging spectrometer 700. The structural elementsof the compact imaging spectrometer 700 include an entrance slit 701, adioptric lens 705-706, an immersive grating 703-704, a catadioptric lens707-708, and a detector 709.

The light passes from the entrance slit 701 through the dioptric lens705-706 and then through the non-reflecting section of the catadioptriclens 707-708, proceeding to the immersive grating 703-704. The lightrefracts through the front of grating 703 and is then dispersed by thereflective grating on the back surface 704, and refracts out through thefront of the grating 703 to catadioptric lens 707-708. This time thelight travels through the surface 708 and is reflected of the backsurface 707, which has a reflective coating on the lower part. The lightrefracts through surface 708 and focuses onto the detector array 709.For detector array 709 the spatial dimension is in the X dimension andthe spectral dispersion is in the Y dimension. The aperture cold stop isclose to surface 703 with the beam from the entrance slit and the exitbeam to the detector approximately telecentric.

The grating can be generated by a ruling engine, replication,holographically, or by e-beam lithography. Grating 703-704 is tilted andwedged such that the ghost reflections from the front 703 of the gratingdo not fall on the detector 709. FIG. 8 is a plan view of thespectrometer shown in FIG. 7 as a cross-sectional view.

The imaging spectrometer 700 has been designed to the requirements inTable 3 and is diffraction limited over the wavelength range withexcellent spatial and spectral resolutions.

The spectral slit curvature has been corrected to less than one tenth ofa pixel over the detector arrays. This is the curvature of slit image onthe detector 709 at a single wavelength, which is a common problem withimaging spectrometer designs. The spatial mapping distortion has alsobeen corrected to less than one tenth of a pixel over the fullwavelength range. This means that the spectrum from a single point inthe entrance slit will not wander from the center of a row of pixels byless than ±2 microns. Correcting the spectral slit curvature and thespatial mapping distortion with wavelength to less than one tenth of apixel ensures that the images do not have to be resampled to correct forthese effects.

One important feature of this design enabling it to be used over a widefield of view than previous designs is that it has zero Petzval fieldcurvature. The field curvature from the positive mirror section is ofopposite sign and cancels with the field curvature sum from the rest ofthe positive refractive surfaces.

Small size for an infrared imaging spectrometer is extremely importantbecause it determines the requirements for the cryogenic cooling. Forexample, if the spectrometer is small it can fly in a small UAV. Theimaging spectrometer 700 has a size envelope that is extremely efficientgiven the 1024 spatial pixel width. The entrance slit 701, catadioptriclens 705-706, dioptric lens 707-708, immersion grating 703-704, anddetector 709 fit within the envelope. The Y axis and the Z axis areshown in the plane of the paper in FIG. 7. The X axis extendsperpendicular to both the Y axis and the Z axis. As shown in FIG. 7, theX axis is 8 cm, the Y axis is 9 cm, and the Z axis is 12 cm. Theentrance slit 701 is located at or near the front and the detector 709is located at or near the back.

The imaging spectrometer of the present invention has many uses.Examples of its use include use in Homeland Defense to check for thepresence of biological or chemical weapons without entering thecontaminated areas. The imaging spectrometer also has use for commercialremote sensing where portability is important. The imaging spectrometercan be used for pollution detection and remote sensing of agriculturalcrops. It can be used for geological identification and for the remotemonitoring of industrial processes. These are examples of the variouspotential applications of the imaging spectrometer of the presentinvention.

While the invention may be susceptible to various modifications andalternative forms, specific embodiments have been shown by way ofexample in the drawings and have been described in detail herein.However, it should be understood that the invention is not intended tobe limited to the particular forms disclosed. Rather, the invention isto cover all modifications, equivalents, and alternatives falling withinthe spirit and scope of the invention as defined by the followingappended claims.

1. A wide field imaging spectrometer apparatus, comprising: an entranceslit for transmitting light, a catadioptric lens, a dioptric lens, animmersion grating, and a detector array, said entrance slit, saidcatadioptric lens, said dioptric lens, said immersion grating, and saiddetector array positioned are wherein said entrance slit transmits lightto said catadioptric lens, said catadioptric lens refracts and reflectssaid light to said immersion grating, and said immersion gratingdisperses and directs said light to said catadioptric lens, saidcatadioptric lens transmits and refracts light to said dioptric lens,said dioptric lens focuses and directs light to said detector array. 2.The wide field imaging spectrometer apparatus of claim 1 wherein saidimmersion grating is fabricated by conventional ruling, by holographicmeans, by diamond cutting or turning means, by e-beam lithography, or byoptically cementing a reflective grating to a prism.
 3. The wide fieldimaging spectrometer apparatus of claim 1 wherein said immersion gratingis fabricated by computer controlled ruling, by holographic means, bydiamond cutting or turning means, or by e-beam lithography withunequally spaced grooves or with curved grooves, or with both propertiesto improve the image forming properties.
 4. The wide field imagingspectrometer apparatus of claim 1 wherein said immersion grating isfabricated on a general aspheric surface to improve the image formingand distortion correction properties.
 5. The wide field imagingspectrometer apparatus of claim 1 wherein said immersion grating isreplaced by a reflective grating and the surfaces of the saidcatadioptric lens and the said dioptric lens are tilted and decenteredto correct for the spectral slit curvature and the spatial mappingdistortion.
 6. The wide field imaging spectrometer apparatus of claim 1wherein the Petzval field curvature sum is zero due to the cancellationof the field curvature between the said catadioptric lens and therefractive surfaces of the said catadioptric lens, the said dioptriclens and the said immersion grating.
 7. The wide field imagingspectrometer apparatus of claim 1 wherein the spectral slit curvatureand the spatial mapping distortion are corrected due to the valueschosen for the radii of curvature of the surfaces and if necessary bythe introduction of aspheric terms on the spherical surfaces.
 8. Thewide field imaging spectrometer apparatus of claim 1 wherein saidsurfaces of the said catadioptric lens have their forms changed tospherical, conic, or general aspheric surfaces to improve the imagingproperties.
 9. The wide field imaging spectrometer apparatus of claim 1wherein said surfaces of the said dioptric lens have their forms changedto spherical, conic, or general aspheric surfaces to improve the imagingproperties.
 10. The wide field imaging spectrometer apparatus of claim 1wherein said surfaces of the said immersion grating have their formschanged to spherical, conic, or general aspheric surfaces to improve theimaging properties.
 11. The wide field imaging spectrometer apparatus ofclaim 1 wherein the said reflective surface of the said catadioptriclens is a formed as a separate section of the back surface with adifferent shape which may be tilted and decentered to improve theimaging properties
 12. The wide field imaging spectrometer apparatus ofclaim 1 wherein said the said catadioptric lens is split into twodifferent lenses with the transmissive and reflective part being aseparate lens from the all transmissive part.
 13. The wide field imagingspectrometer apparatus of claim 1 wherein the said dioptric lens isdecentered with respect to the said catadioptric lens to correct thespectral slit distortion and the spatial mapping distortion.
 14. Thewide field imaging spectrometer apparatus of claim 1 wherein said thesaid immersion grating is decentered with respect to the saidcatadioptric lens to correct the spectral slit distortion and thespatial mapping distortion, and to improve the imaging properties. 15.The wide field imaging spectrometer apparatus of claim 1 wherein theaperture cold stop is placed close to the immersion grating to ensureapproximate telecentricity of the beams focused on the detector.
 16. Thewide field imaging spectrometer apparatus of claim 1 wherein anadditional lens is placed in front of or behind the entrance slit tocontrol the pupil imaging properties.
 17. The wide field imagingspectrometer apparatus of claim 1 wherein an additional lens is placedin front of detector to help compensate the field aberrations and tocontrol the telecentricity of the beams imaged on the detector.
 18. Awide field imaging spectrometer apparatus, comprising: an entrance slitfor transmitting light, a dioptric lens, a catadioptric lens, animmersion grating, and a detector array, said entrance slit, saidcatadioptric lens, said dioptric lens, said immersion grating, and saiddetector array positioned are wherein said entrance slit transmits lightto said to said dioptric lens, said dioptric lens transmits light tosaid catadioptric lens, said catadioptric lens refracts said light tosaid immersion grating, and said immersion grating disperses and directssaid light to said catadioptric lens, said catadioptric lens transmitsand reflects said light to said detector array.
 19. The wide fieldimaging spectrometer apparatus of claim 18 wherein said immersiongrating is fabricated by conventional ruling, by holographic means, bydiamond cutting or turning means, by e-beam lithography, or by opticallycementing a reflective grating to a prism.
 20. The wide field imagingspectrometer apparatus of claim 18 wherein said immersion grating isfabricated by computer controlled ruling, by holographic means, bydiamond cutting or turning means, or by e-beam lithography withunequally spaced grooves or with curved grooves, or with both propertiesto improve the image forming properties.
 21. The wide field imagingspectrometer apparatus of claim 18 wherein said immersion grating isfabricated on a general aspheric surface to improve the image formingand distortion correction properties.
 22. The wide field imagingspectrometer apparatus of claim 18 wherein said immersion grating isreplaced by a reflective grating and the surfaces of the saidcatadioptric lens and the said dioptric lens are tilted and decenteredto correct for the spectral slit curvature and the spatial mappingdistortion.
 23. The wide field imaging spectrometer apparatus of claim18 wherein the Petzval field curvature sum is zero due to thecancellation of the field curvature between the said catadioptric lensand the refractive surfaces of the said catadioptric lens, the saiddioptric lens and the said immersion grating.
 24. The wide field imagingspectrometer apparatus of claim 18 wherein the spectral slit curvatureand the spatial mapping distortion with wavelength are corrected due tothe values chosen for the radii of curvature of the said surfaces and ifnecessary by the introduction of aspheric terms on the sphericalsurfaces.
 25. The wide field imaging spectrometer apparatus of claim 18wherein said surfaces of the said catadioptric lens have their formschanged to spherical, conic, or general aspheric surfaces to improve theimaging properties.
 26. The wide field imaging spectrometer apparatus ofclaim 18 wherein said surfaces of the said dioptric lens have theirforms changed to spherical, conic, or general aspheric surfaces toimprove the imaging properties.
 27. The wide field imaging spectrometerapparatus of claim 18 wherein said surfaces of the said immersiongrating have their forms changed to spherical, conic, or generalaspheric surfaces to improve the imaging properties.
 28. The wide fieldimaging spectrometer apparatus of claim 18 wherein the said reflectivesurface of the said catadioptric lens is a formed as a separate sectionof the back surface with a different shape which may be tilted anddecentered to improve the imaging properties.
 29. The wide field imagingspectrometer apparatus of claim 18 wherein the said catadioptric lens issplit into two different lenses with the transmissive and reflectivepart being a separate lens from the all transmissive part.
 30. The widefield imaging spectrometer apparatus of claim 18 wherein the saiddioptric lens is decentered with respect to the catadioptric lens tocorrect the spectral slit distortion and the spatial mapping distortion.31. The wide field imaging spectrometer apparatus of claim 18 whereinthe said immersion grating is decentered with respect to thecatadioptric lens to correct the spectral slit distortion and thespatial mapping distortion, and to improve the imaging properties. 32.The wide field imaging spectrometer apparatus of claim 18 wherein thecold aperture stop is placed close to the immersion grating to ensureapproximate telecentricity of the beams focused on the detector.
 33. Thewide field imaging spectrometer apparatus of claim 18 wherein anadditional lens is placed in front of or behind the entrance slit tocontrol the pupil imaging properties.
 34. The wide field imagingspectrometer apparatus of claim 18 wherein an additional lens is placedin front of detector to help compensate the field aberrations and tocontrol the telecentricity of the beams imaged on the detector.
 35. Awide field imaging spectrometer apparatus of claim 1 wherein thepositions of the catadioptric lens and the dioptric lens areinterchanged. The resulting wide field imaging spectrometer comprises:an entrance slit for transmitting light, a dioptric lens, a catadioptriclens, an immersion grating, and a detector array, said entrance slit,said dioptric lens, said catadioptric lens, said immersion grating, andsaid detector array positioned are wherein said entrance slit transmitslight to said dioptric lens, said dioptric lens refracts and directssaid light to said catadioptric lens. Said light refracts through frontsurface of said catadioptric lens reflects off the back surface andrefracts out of said front surface of said catadioptric lens to saiddioptric lens, said dioptric lens refracts said light to said immersiongrating, said immersion grating disperses and directs said light to saiddioptric lens, said dioptric lens refracts light to said catadioptriclens which transmits and refracts said light to said detector array. 36.The wide field imaging spectrometer apparatus of claim 35 wherein saidimmersion grating is fabricated by conventional ruling, by holographicmeans, by diamond cutting or turning means, by e-beam lithography, or byoptically cementing a reflective grating to a prism.
 37. The wide fieldimaging spectrometer apparatus of claim 35 wherein said immersiongrating is fabricated by computer controlled ruling, by holographicmeans, by diamond cutting or turning means, or by e-beam lithographywith unequally spaced grooves or with curved grooves, or with bothproperties to improve the image forming properties.
 38. The wide fieldimaging spectrometer apparatus of claim 35 wherein said immersiongrating is fabricated on a general aspheric surface to improve the imageforming and distortion correction properties.
 39. The wide field imagingspectrometer apparatus of claim 35 wherein said immersion grating isreplaced by a reflective grating and the surfaces of the saidcatadioptric lens and the said dioptric lens are tilted and decenteredand have their shaped changed to correct for the spectral slit curvatureand the spatial mapping distortion.
 40. The wide field imagingspectrometer apparatus of claim 35 wherein the Petzval field curvaturesum is zero due to the cancellation of the field curvature between thesaid reflective surface of the said catadioptric lens and the refractivesurfaces of the said catadioptric lens, the said dioptric lens and thesaid immersion grating.
 41. The wide field imaging spectrometerapparatus of claim 35 wherein the spectral slit curvature and thespatial mapping distortion are corrected due to the values chosen forthe radii of curvature of the surfaces and if necessary by theintroduction of aspheric terms on the spherical surfaces.
 42. The widefield imaging spectrometer apparatus of claim 35 wherein said surfacesof the said catadioptric lens have their forms changed to spherical,conic, or general aspheric surfaces to improve the imaging properties.43. The wide field imaging spectrometer apparatus of claim 35 whereinsaid surfaces of the said dioptric lens have their forms changed tospherical, conic, or general aspheric surfaces to improve the imagingproperties.
 44. The wide field imaging spectrometer apparatus of claim35 wherein said surfaces of the said immersion grating have their formschanged to spherical, conic, or general aspheric surfaces to improve theimaging properties.
 45. The wide field imaging spectrometer apparatus ofclaim 35 wherein the said reflective surface of the said catadioptriclens is formed as a separate section of the back surface with adifferent shape which may be tilted and decentered to improve theimaging properties.
 46. The wide field imaging spectrometer apparatus ofclaim 35 wherein the said catadioptric lens is split into two differentlenses with the transmissive and reflective part being a separate lensfrom the all transmissive part.
 47. The wide field imaging spectrometerapparatus of claim 35 wherein the said dioptric lens is decentered withrespect to the said catadioptric lens to correct the spectral slitdistortion and the spatial mapping distortion.
 48. The wide fieldimaging spectrometer apparatus of claim 35 wherein the said immersiongrating is decentered with respect to the said catadioptric lens tocorrect the spectral slit distortion and the spatial mapping distortion,and to improve the imaging properties.
 49. The wide field imagingspectrometer apparatus of claim 35 wherein the aperture cold stop isplaced close to the immersion grating to ensure approximatetelecentricity of the beams focused on the detector.
 50. The wide fieldimaging spectrometer apparatus of claim 35 wherein an additional lens isplaced in front of or behind the entrance slit to control the pupilimaging properties.
 51. The wide field imaging spectrometer apparatus ofclaim 35 wherein an additional lens is placed in front of detector tohelp compensate the field aberrations and to control the telecentricityof the beams imaged on the detector.
 52. The wide field imagingspectrometer apparatus of claim 1 wherein the powers and shapes of thecatadioptric lens, dioptric lens, and immersive grating are adjusted toaccommodate different spatial magnifications.
 53. The wide field imagingspectrometer apparatus of claim 18 wherein the powers and shapes of thecatadioptric lens, dioptric lens, and immersive grating are adjusted toaccommodate different spatial magnifications.
 54. The wide field imagingspectrometer apparatus of claim 35 wherein the powers and shapes of thecatadioptric lens, dioptric lens, and immersive grating are adjusted toaccommodate different spatial magnifications.